《Image Processing and Pattern Recognition》是Wiley-IEEE Press出版的圖書，作者是Frank Y. Shih
基本介紹
- ISBN：9780470404614
- 作者：Frank Y. Shih
- 出版社：Wiley-IEEE Press
- 出版時間：2010年5月3日
- 頁數：552
- 定價：USD 125.00
- 裝幀：Hardcover
內容簡介
A comprehensive guide to the essential principles of image processing and pattern recognition Techniques and applications in the areas of image processing and pattern recognition are growing at an unprecedented rate. Containing the latest state-of-the-art developments in the field, Image Processing and Pattern Recognition presents clear explanations of the fundamentals as well ...(展開全部) A comprehensive guide to the essential principles of image processing and pattern recognition Techniques and applications in the areas of image processing and pattern recognition are growing at an unprecedented rate. Containing the latest state-of-the-art developments in the field, Image Processing and Pattern Recognition presents clear explanations of the fundamentals as well as the most recent applications. It explains the essential principles so readers will not only be able to easily implement the algorithms and techniques, but also lead themselves to discover new problems and applications. Unlike other books on the subject, this volume presents numerous fundamental and advanced image processing algorithms and pattern recognition techniques to illustrate the framework. Scores of graphs and examples, technical assistance, and practical tools illustrate the basic principles and help simplify the problems, allowing students as well as professionals to easily grasp even complicated theories. It also features unique coverage of the most interesting developments and updated techniques, such as image watermarking, digital steganography, document processing and classification, solar image processing and event classification, 3-D Euclidean distance transformation, shortest path planning, soft morphology, recursive morphology, regulated morphology, and sweep morphology. Additional topics include enhancement and segmentation techniques, active learning, feature extraction, neural networks, and fuzzy logic. Featuring supplemental materials for instructors and students, Ima
