《Atom Probe Field Ion Microscopy》是1996年Oxford Univ Pr出版的圖書，作者是Miller, M. K. (EDT)、Cerezo, A.、Hetherington, M. G.、Smith, G. D. W.。
場離子顯微鏡（Field ion microscopy，簡稱FIM）和原子探針（atom probe）技術提供了放大倍數更高（一般在300萬倍以上）的觀測方法，可在原子尺度對材料表面的位錯進行直接觀測。位錯源 材料中的位錯密度會隨著塑性形變的進行而增加。由這一關係可以推測，材料內部必然存在著位錯的起源與增殖的機制，這些機制在外加應力的...
場離子顯微鏡（Field ion microscopy，簡稱FIM）和原子探針（atom probe）技術提供了放大倍數更高（一般在300萬倍以上）的觀測方法，可在原子尺度對材料表面的位錯進行直接觀測。位錯源 材料中的位錯密度會隨著塑性形變的進行而增加，其數量大致滿足關係：其中 τ 為塑性流動應力，ρ 為位錯密度。由這一關係可以推測，...
4. Z.G.Liu,G.Frommeyer and M.Kreuss: Atom-probe FIM investigation on the intermetallic NiAl phase with B2 superlattice structure, Surf.Sci.246, 272 (1991)5. Z.G.Liu,T. AI-Kassab and P.Haasen: The phase separation in a NiBe alloy as studied by atom probe field ion microscopy, Surf...
2ScanningNear FieldOpticalMicroscopyinNanosciences25 2.1ScanningNear FieldOpticalMicroscopyandNanotechnology25 2.2BasicConcepts26 2.3Instrumentation27 2.3.1ProbeFabrication28 2.3.2FlexibilityofNear FieldMeasurements33 2.4ApplicationsinNanoscience35 2.4.1FluorescenceMicros...
5 Scanning Probe Microscopy for Nanoscale Manipulation and Patterning 5.1 Introduction 5.1.1 Nanoscale Toolbox for Nanotechnologists ……6 Scanning Thermal and Thermoelectric Microscopy 7 Imaging Secondary Ion Mass Spectrometry 8 Atom Probe Tomography 9 Focused Ion Beam System—a Multifunctional Tool for...
1.3.2SuperparamagneticandLowStrayMagneticField MFMTips13 1.3.3Electron\|Beam\|Induced\|Deposited (EBID)MFMTips15 1.3.4Point\|DipoleMFMTips17 1.3.5FocusedIonBeamMillingMFMTips20 References22 2LorentzMicroscopyandHolographyCharacterizationofMagnetic Materials24 2.1Introduction24 2.2Instrumentation25 2....
2020. Probing composition distributions in nanoalloy catalysts with correlative electron microscopy. Journal of Materials Chemistry A 8, pp. 15725-15733. (10.1039/D0TA00334D) McVicker, R. et al. 2020. Low temperature selective oxidation of methane using gold-palladium colloids. Catalysis Today 342...
4 Advanced Transmission Electron Microscopy of Nanostructured Magnetic Materials 4.1 Introduction 4.2 Specimen Preparation 5 M *ssbauer Spectroscopy Characterization of Soft Magnetic Nanocrystalline Alloys 6 Atom Probe Characterization of Microstructures of Nanocrystalline and Nanocomposite Magnetic Materials 7 ...
