《Fundamentals of Modern VLSI Devices》是Cambridge University Press出版的圖書，作者是Yuan Taur，Tak H. Ning
基本介紹
- ISBN：9780521832946
- 作者：Yuan Taur、Tak H. Ning
- 出版社：Cambridge University Press
- 出版時間：2009年8月28日
- 頁數：680
- 定價：USD 105.00
- 裝幀：Hardcover
內容簡介
Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally-renowned authors highlight the intricate interdependencies and subtle tradeo...(展開全部) Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally-renowned authors highlight the intricate interdependencies and subtle tradeoffs between various practically important device parameters, and also provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices. Equations and parameters provided are checked continuously against the reality of silicon data, making the book equally useful in practical transistor design and in the classroom. Every chapter has been updated to include the latest developments, such as MOSFET scale length theory, high-field transport model, and SiGe-base bipolar devices.
